500 kVA DVR for Wafer and Semiconductor Testing Equipment in Shanghai
A semiconductor testing facility in Shanghai installed a 500 kVA Winzpower Dynamic Voltage Restorer for wafer testing and semiconductor-related testing equipment. The 3-phase 400 V DVR is configured for a maximum voltage sag depth of 50%, equal to 50% residual voltage, with a required support duration of 1 second.
The project was implemented for 上海华岭申瓷集成电路有限责任公司, referred to in this case as the Shanghai Hualing semiconductor testing facility. Because a formal English legal company name was not confirmed in the supplied materials, the descriptive English project name is used rather than an invented translation. The Dynamic Voltage Restorer (DVR) is installed on the dedicated low-voltage feeder serving the protected testing equipment.
Project Background
Wafer testing and semiconductor-related testing equipment can be sensitive to short reductions in supply voltage. The protection requirement for this project was therefore defined around the selected testing-equipment feeder rather than around the complete facility distribution system.
The available project information identifies the industry, application category, system voltage, DVR rating, sag depth, residual voltage, support duration, and installed enclosure. It does not identify specific test platforms, equipment brands, internal production-line arrangements, or test parameters. Those details are outside the documented project scope and are intentionally not inferred from the installation photograph.
Voltage Sag Protection Requirement
For this project, a 50% voltage sag leaves 50% residual voltage. The equal percentages do not make the terms interchangeable: sag depth describes the voltage lost, while residual voltage describes the voltage remaining at the design condition.
| Item | Project Requirement |
|---|---|
| Customer | Shanghai Hualing semiconductor testing facility |
| Industry | Semiconductor / wafer testing |
| System Voltage | 400 V |
| Phase | 3-phase |
| DVR Capacity | 500 kVA |
| Maximum Sag Depth | 50% |
| Minimum Residual Voltage | 50% |
| Required Support Duration | 1 s |
| Protected Load | Wafer testing and semiconductor-related testing equipment |
DVR Configuration
The installed DVR is rated 500 kVA at 3-phase 400 V. Its project configuration is based on the feeder capacity together with the 50% sag-depth and 1-second support requirements. This combination defines a materially different duty from a quotation based only on “500 kVA,” because the compensation depth and support time also affect the required DVR configuration.
The supplied project data does not state cabinet dimensions, system fault level, transformer impedance, switchgear models, or individual downstream equipment ratings. These values are therefore not added to this case study.
Electrical Connection and Protection Boundary
The electrical arrangement follows this sequence:
Transformer → Main LV Distribution Cabinet → Sensitive Equipment Feeder → DVR → Protected Testing Equipment
The DVR is installed on the dedicated low-voltage feeder supplying the sensitive testing equipment rather than on the entire plant bus. The protected-load boundary begins downstream of the DVR and covers the selected wafer and semiconductor testing load. General facility loads outside that feeder are not represented as protected by this system.
On-Site Installation
The site photograph documents the real 500 kVA DVR enclosure in the facility’s industrial installation area. The image shows the installed equipment and surrounding access space but is not used to infer the identity or arrangement of downstream semiconductor test equipment.
Engineering Outcome
The project provides a dedicated voltage-sag protection layer between the main low-voltage distribution system and the sensitive testing-equipment feeder. The installed DVR is configured to support the protected load through a 50% sag-depth condition for the required 1-second duration.
The supplied evidence confirms the installation and the specified engineering configuration. It does not include an event-recorder waveform from a post-installation voltage sag, trip history, production-loss data, or measured downtime reduction. No claim is therefore made that every connected load has completed a recorded event without interruption; equipment ride-through also depends on the approved project configuration and the tolerance of the protected load.
Project Summary
This Shanghai project uses a 500 kVA, 3-phase 400 V DVR on a dedicated feeder for wafer and semiconductor-related testing equipment. The design requirement is 50% sag depth, 50% residual voltage, and 1 second of support. The feeder-level connection keeps the protection boundary aligned with the sensitive testing load instead of automatically sizing protection around the entire facility.
For a structured list of the information required before selecting a similar configuration, see the DVR Selection & RFQ Guide.
Detailed process-equipment information is intentionally omitted to protect customer confidentiality and semiconductor production security.
Related Product
Dynamic Voltage Restorer (DVR): Winzpower DVR systems provide voltage-sag compensation on the low-voltage side of a protected feeder or process transformer, so the protected load is supported through the specified sag depth and support duration.
